Single Silicene Sheet with Continuous Superstructure Domains Using a Flexible Ultrathin Ag(111) Template on Si(111)
Hung-Chang Hsu1*, Yi-Hung Lu1, Wen-Chin Lin1, Tsu-Yi Fu1
1physics, National Taiwan normal university, Taipei, Taiwan
* presenting author:Hung-Chang Hsu, email:hsiuta617@gmail.com
Using scanning tunneling microscopy, we studied the formation of silicene on an ultrathin Ag(111) film with a thickness of 6–12 monolayers, which was prepared on a Si(111) substrate. A low-energy electron diffraction pattern with an oval spot demonstrated that the ultrathin Ag(111) film was more flexible than single-crystal Ag(111). After silicene fabrication, we measured the classical 4×4, , and 2 silicene superstructures, which have been confirmed in previous studies. Growing silicene on Ag(111) bulk usually results in the formation of a defect boundary between each superstructure and thus discontinuous silicene sheet formation. By comparing the angle between each silicene superstructure on the ultrathin Ag(111) film and Ag(111) bulk, we discovered that a continuous silicene sheet without obvious defects between various superstructures had formed on the ultrathin Ag(111) film. The formation of a continuous silicene sheet was attributed to the domain rotation and lateral shift of the ultrathin Ag(111) film.


Keywords: silicene, STM, 2-D material